The following operating modes are available:
Continuity Mode:
All of the DUT pins are initially connected to ground. Then each pin
is first disconnected from ground, and then connected to the VI-source.
Current is swept between the programmed limits, and the voltage is
measured and plotted. The result will produce the characteristic IV-curve
of the protection diodes. Since only one pin is tested at one time,
while the remaining device pins are grounded, pin-to-pin shorts may
be detected, in addition to shorts to ground and open circuits.
Leakage Mode:
Leakage tests are automatically performed on all of the user-selected
pins. Power is applied to the device at the specified voltage, a static
vector is applied, and a voltage is forced on the pin-under-test. The
resulting low value current is measured, and compared with the limits.
Pre ESD Zap Mode:
Each pin of the device is sequencially traced, and the results are
stored in a disk file. The device is then removed from the tester, and "zapped" with
an ESD gun (not included).
Post ESD Zap Mode:
After "zapping", each DUT pin is re-traced, and the results are
compared to the stored Pre-Zap data. A 2-dimensional "mask" is
included on the IV-curve, with its boundaries determining the minimum and
maximum allowable differences. If a point is plotted outside this mask,
the pin is considered a failure.
Engineering Mode:
Often, a simple curve-trace is required on 1 pin, a group of pins,
or all pins. This mode enables the user to select which pins are to be
traced, between what compliances, etc. |
