The ATE (Automatic Test Equipment) software allows the IC100 to function as a regular test system for wafer sort and final test applications. This includes all of the capabilities that one would normally expect from the big ATE systems, like datalogging, summary sheet, lot info, etc. Programming the test conditions and limits is easy, using the spreadsheet GUI.

Spreadsheet
The spreadsheet contains the information that the user programs to tell the tester how to perform each test. When the program is first loaded, the shell opens and displays the spreadsheet like this example:

Each row is a test. Each column is either a DUT pin, or some useful information that is required and often referred to. These include: Test Name, Relay (loadboard), PUT (Pin Under Test), Min and Max limits, Units for these limits, and the Bin number.

PROGRAMMING THE PINS:
When any cell in a row is double-clicked, a large dialog box opens. This box is where most of the user programming is done. It has various tabs for each of the columns along the row, plus other necessary information.

Notice the 5 tabs for Anode, Cathode, Emitter, Collector, and Base. These are the DUT pins, and all of these tabs are the same. Each DUT pin is assigned a VI-Source, and the tabs let the user program a force and sense value.

There is also a provision for a ramp test, and a simple display of the resulting IV curve. To produce this ramp and curve display, check the Ramp Test box. The appearance of the tab will change to something like this:

The software will execute the ramp in this example by starting with forcing 0uA on the base, and then 0.5uA, 1uA, 1.5uA ... up to 20uA. The tester will measure the voltage at each step. If the Show Chart box is checked, then after the test has completed, a simple current-versus-voltage graph will pop up on the screen.